Friday, May 11, 2018

Radiated Noise Measurements With TekBox TEMcells and Siglent SpecAn

An affordable set up consisting of a Siglent Spectrum Analyzer SSA 3021X and a Tekbox TEMcell can be successfully used to measure and reduce radiated emission issues.

The setup of the DUT inside a TEM cell gives a very repeatable result without the requirement to accurately re-position the DUT after every improvement modification. While EMC probes are ideal to exactly locate/identify the source of emissions on a PCB, the strength of the TEM cell is its capability to exactly measure the relative improvement with respect to the emission amplitude after modifications in order to achieve compliance. It is also very practical to measure complete emissions of a product consisting of several separate devices and the interconnecting cables.

The test setup requires only little space and can pay for itself rapidly, avoiding expensive anechoic chamber costs.

  


Actual use example here

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