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What is V-I Signature Testing?
What is V-I Signature Testing? Powerful Solutions in
PCB Repair and Test Technologies; SYSTEM 8 Advanced Matrix Scanner (AMS) V-I
signature testing is an established and reliable technique for component fault
finding on both analog and digital boards. An AC voltage is applied to a test
point (via a current limiting resistor) and the resulting current is measured.
The results are plotted on a voltage/current graph which displays the signature
of the test point.
Analysis of a V-I signature, usually by comparison with a
reference, can lead to finding faults such as: -Leaky components -Internally
damaged components -Incorrect value components -Inconsistent components -Short
and open circuits Increased fault coverage with frequency sweep The Advanced
Matrix Scanner (AMS) module increases the fault coverage by varying the
frequency of the AC voltage at which the V-I signature is acquired. The
resulting curve is plotted in three dimensions which allows the variations of
the V-I signatures to be observed over a frequency range. This can lead to
finding faults that are not visible with a standard V-I analysis.
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